Beckman.com is conducting maintenance Saturday, September 19th and Sunday, September 20th. Parts of the site may have limited accessibility throughout the weekend. During this time, orders can still be placed by calling Client Services. We look forward to providing an improved customer experience. Beckman.com will return Monday, September 21st.
LS 13 320 XR Particle Size Analyzer
For big improvements that help you spot small differences.
The LS 13 320 XR offers best-in-class particle size distribution data from advanced PIDS technology,* which enables high-resolution measurements and an expanded dynamic range. Like the LS 13 320, the XR particle size analyzer provides fast, accurate results, and helps you streamline workflows to optimize efficiency. Some big improvements help you reliably spot small differences that can have a huge impact on your particle analysis data.
Direct measurement range from 10 nm – 3,500 µm
highlights pass/fail results for faster quality control Enhanced software that simplifies method creation for standardized measurements
control standards to adequately verify instrument/module performance
Documentation and Application Notes
LS 13 320 XR Particle Size Analyzer Features
Spot Small Differences
Expanded measurement range: 10 nm – 3,500 µm
Laser diffraction plus advanced Polarization Intensity Differential Scattering ( PIDS) technology enable high-resolution measurement & reporting of real data down to 10 nm Provides accurate, reliable detection of multiple particle sizes in a single sample
ADAPT Software features automatic pass/fail check Pre-configured methods deliver results with 3 clicks or less
Simplifies analyzer operation by experts & novice users alike
1-click overlay with historical data
Intuitive user diagnostics keep you informed during sampling
Simplified method creation for standardized measurements
ADAPT Software enables 21 CFR Part 11
Customizable security system to meet diverse needs
Choose from 4 security levels
High-security configuration supports
21 CFR Part 11
PIDS Technology* for Direct Detection of 10 nm Particles
3 light wavelengths (450, 600, & 900 nm) irradiate samples with vertical & horizontal polarized light
Analyzer measures scattered light from samples over a range of angles
Differences between horizontally & vertically radiated light for each wavelength yield high-resolution particle size distribution data
LS 13 320 XR Particle Size Analyzer Specifications
Beckman Coulter, Inc. All rights reserved.
NOT ALL PRODUCTS ARE AVAILABLE IN ALL COUNTRIES.
PRODUCT AVAILABILITY AND REGULATORY STATUS DEPENDS ON COUNTRY REGISTRATION PER APPLICABLE REGULATIONS
The listed regulatory status for products correspond to one of the below:
IVD: In Vitro Diagnostic Products. These products are labeled "For In Vitro Diagnostic Use."
ASR: Analyte Specific Reagents. These reagents are labeled "Analyte Specific Reagents. Analytical and performance characteristics are not established."
CE: Products intended for in vitro diagnostic use and conforming to European Directive (98/79/EC). (Note: Devices may be CE marked to other directives than (98/79/EC)
RUO: Research Use Only. These products are labeled "For Research Use Only. Not for use in diagnostic procedures."
LUO: Laboratory Use Only. These products are labeled "For Laboratory Use Only."
No Regulatory Status: Non-Medical Device or non-regulated articles. Not for use in diagnostic or therapeutic procedures.